No. 2, 2017
Accounting for Software and Algorithmic Protection Tools from Single Event Effects in the Process of Evaluating the Radiation Hardness of Equipment

K.G. Sizova1, P.K. Skorobogatov2, E.L. Chumakov1, D.E. Meleshkevich1

1LLC “NPC “Granat”
Saint Petersburg, Russia
e-mail: ksizova@npcgranat.ru
2National Research Nuclear University “MEPhI”
Moscow, Russia

The estimation problem of error detection and correction code efficiency as means of single event effects (single event upsets) protection in digital devices, occurring under the influence of the space charged particles, is considered. A new version of the existing calculated and experimental evaluation method described in the standard [1] in terms of accounting protection tools against single event upsets (soft error), based on the application of the reliability theory mathematical apparatus is proposed. The results of testing a static random access memory (SRAM) with and without using error-correcting coding are presented. Experimental and calculated efficiency coefficients of application coding are obtained and comparative analyzed.

Keywords: probability, software and algorithmic methods, protection, error detection and correction code, upset, ionizing radiation, single event effects, radiation hardness, tolerance, efficiency, performance, calculation and experimental evaluation method, electronic equipment.
Identification of Abnormal Dose Effects at Selective Tests of Critical Electronic Components from Flight Parties

V.M. Zykov1, P.V. Rubanov1, Yu.V. Maximov2

1Tomsk Polytechnic University
Tomsk, Russia
e-mail: pvr@tpu.ru
2Academician M.F. Reshetnev Information Satellite Systems
Zheleznogorsk, Krasnoyarsk region, Russia

Distinctive features of selective radiation resistance tests technique of critical electronic components from flight parties to influence of dose space factors are presented. Examples of the found abnormal dose effects in electronic components from flight parties are given. These results can be rationale for radiation resistance tests of such electronic components to influence of dose space factors for providing a hardness guarantee and a weight-size parameters reduction of onboard equipment.

Keywords: electronic components, dose effects, ELDRS, radiation hardness, irradiation, annealing, tests, flight party, onboard equipment, space.
Influence of Temperature and Preirradiation on the Single Events in MOS Devices at Neutron Influence with Energy of 14 MeV

N.V. Basargina, I.V. Vorozhtsova, S.M. Dubrovskih, T.V. Kupyrina, O.V. Tkachev, V.P. Shukailo, P.S. Primenko

FSUE “RFNC – Academician E.I. Zababakhin All-Russian Research Institute of Technical Physics”
Snezhinsk, Chelyabinsk region, Russia
e-mail: dep5@vniitf.ru

Research results of temperature and preliminary reactor radiation influence on the single events in powerful MOS devices at impact of neutrons with energy of 14 MeV are presented. It is shown that preirradiation and the increased temperature lead to building-up of a voltage single events threshold. The temperature measurements are specified that observed single events are probably caused the nonequilibrium carriers avalanche, created in primary interaction of neutron with device active area.

Keywords: MOS transistor, neutrons with energy of 14 MeV, single events.
About Influence of Electromagnetic Radiation and Joint Influence of Electromagnetic and Pulse Ionizing Radiation on Electronic Equipment Products

G.P. Rudnev

The branch of JSC SRC "Progress" - SPE "OPTEKS"
Moscow, Russia
e-mail: konbur@bk.ru

The mechanism of appearance of electromagnetic pulse impact on radio-electronic equipment is found up. Some features of electrical overload impact on bipolar transistors and thin-film capacitors are considered. The technique of synchronization of joint influence of discharge electrical pulse and ionizing radiation pulse and its results are presented.

Keywords: electromagnetic pulse, pulse ionizing radiation, impulse electric strength, secondary breakdown.
Measurement of Time Resolution CdTe-Detectors and Recording Channel of X-ray Subnanosecond Pulses

S.L. Elyash, A.L. Yuryev, T.V. Loyko, A.V. Rodigin

FSUE “RFNC – All-Russian Research Institute of Experimental Physics”
Sarov, Nizhny Novgorod region, Russia
e-mail: elyash@expd.vniief.ru

In All-Russian Research Institute of Experimental Physics the small-size subnanosecond electron accelerator is developed. The measured time resolution of recording channel of X-ray subnanosecond pulses makes ~ (111-117) ps. Duration τ0,5 of registered current pulse of an electron beam of the subnanosecond accelerator is in the range (230-270) ps. Taking into account the calibration of recording channel and duration of electron radiation the pulse responses of CdTe-detectors SPPD-29k and SPPD-29-02 on half-amplitude made τ0,5 ≈ 320±30 ps and τ0,5 ≈ 450±30 ps respectively.

Keywords: accelerator, gas-filled shaper, subnanosecond voltage pulses, time resolution.
Monitors of Proton Flows with Energies of 50-1000 MeV

D.A. Amerkanov, G.I. Gorkin, E.M. Ivanov, N.A. Ivanov, E.A. Kotikov, O.V. Lobanov, V.V. Pashuk

Petersburg Nuclear Physics Institute named by B.P. Konstantinov of NRC “Kurchatov Institute”
Gatchina, Russia
e-mail: dmitriysno@gmail.com

The absolute monitors providing directly during the experiment the measurement of complete number of protons with energy of 50-1000 MeV in the range of flows 106-109 s-1 are developed and tested. As a detector is used the two-section ionization chamber with apertures of 10 and 20 cm with air at normal pressure. To analyze the density distribution of proton flux with different energies in a beam were used the beam photos. Therewith the technique of computation of proton number falling on any given area of beam cross section was developed and experimentally tested.

Keywords: two-section ionization chamber, proton flow.
Operating Experience of the Measuring Procedure of the Maximum of Exposure Dose Rate at Accelerators LIU-10 and UIN-10

N.I. Terentyev, V.V. Kazakov, Yu.S. Loyko

Research Institute of Scientific Instruments
Lytkarino, Moscow region, Russia
e-mail: vvkazakov@niipribor.ru

The results of the exposure dose rate pulse form measuring at the distances 2, 10, 20 cm and 1,2 m from target during one year using of the procedure are analyzed. The difference of pulse duration near the target in comparison with distance 1,2 m is detected. The analytic formulas for amplitude reduction factors Kar are received. The new procedure detectors and integral IS-7 are compared. The experimental spectral sensitivity factors Ksp of the detectors on all accelerators are determined. The recommendations on procedure perfection are given.

Keywords: exposure dose rate pulse form, measuring procedure, diamond detectors, electron accelerators LIU-10 and UIN-10, comparison of dynamic and integral detectors.
The Features of the Pulse Form of Exposure Dose Rate of Accelerator UIN-10

N.I. Terentyev, V.V. Kazakov, Yu.S. Loyko

Research Institute of Scientific Instruments
Lytkarino, Moscow region, Russia
e-mail: vvkazakov@niipribor.ru

The exposure dose rate pulse form near the target and at the distances 45 cm and 1 m during one year using of 195 procedure is analyzed. The difference of pulse form and duration near the target in comparison with distance 1 m are detected. In need of precise measurements of dose rate near a target, it is offered to testers to carry out them directly on objects.

Keywords: exposure dose rate pulse form, measuring procedure, diamond detectors, electron accelerator UIN-10.
About the Possibility of Using Nonlinear Element in the Electrical Circuit

T.B. Mavlyudov

Research Institute of Scientific Instruments
Lytkarino, Moscow region, Russia
e-mail: Mavludov@gmail.com

The task connected to existence of a nonlinear element in an electrical circuit is considered. Nonlinearity is caused by temperature condition of an element. The numerical algorithm taking into account practical recommendations for tasks of this kind is offered. The possibility of calculation of additional characteristics on the basis of the received results is shown.

Keywords: nonlinear element, heat conduction equation, resistor.