No. 4, 2021
Topical Issues in Assessing Hardness of Electronic Component Base to Effect of Absorbed Dose of Ionizing Space Radiation

K.I. Tapero

Research Institute of Scientific Instruments
Lytkarino, Moscow Region, Russia

The current state of methods of testing and assessing hardness of products of electronic component base to the effect of ionizing space radiation in regards to dose effects is seen into. A number of peculiarities and issues of concern in this area is brought out: independent simulation of ionizing and structure dose effects; availability of various methods of accelerated tests, considering low-intensity radiation effects, showing different results; the absence of methods of determinative tests, considering joint action of ionizing and structure effects; the possibility of non-additive nature of interaction of ionizing and structure effects, which isn’t taken into consideration by the existing methodological support of the tests. Furthermore, some topical issues are reviewed in relation to the applicability of the electronic component base compliance assessment based on test results of the equipment units, as well as an analytical assessment of the electronic component base compliance with the preset requirements on hardness.

Keywords: electronic component base, ionizing space radiation, radiation tests, dose effects.
Optimization of Methodology of Electronics Testing for Dielectric Strength

V.I. Vanin

JSC "Russian Scientific Research Institute "Electronstandart”
Saint Petersburg, Russia
e-mail: v-vanin@mail.ru

A methodology of testing electronic products for pulse dielectric strength is proposed, which allows reducing significantly the required number of electronic products for testing, and the volume of measurements of their parameters during tests.

Keywords: electronic products, microchips, pulse dielectric strength, single voltage pulse, active and passive electric modes of microchip tests.
Effect of Co-occurring Pulse Voltage on Single Event Upset Cross-Section in SRAM Microcircuits under Influence of 14 MeV neutrons

O.V. Tkachev, A.S. Kustov, K.D. Koksharova

FSUE “Russian Federal Nuclear Center – Academician E.I. Zababakhin
All-Russian Research Institute of Technical Physics”
Snezhinsk, Chelyabinsk region, Russia
e-mail: dep5@vniitf.ru

The article presents the research results of SRAM microcircuit reaction under combined impact of voltage pulses and stationary stream of 14 MeV neutrons. It is shown that the cross-section of single event upsets in a memory chip, caused by neutron exposure, depends on the frequency of voltage pulse feed and temperature of samples.

Keywords: microcircuit, SRAM, stationary stream of neutrons, single event upsets, relaxation processes, activation energy.
Life Appraisal Study of Radiation-Hard Equipment for Offshore Area Monitoring

F.F. Nezamutdinov1, S.A. Filatov2

1JSC "Concern Avrora Scientific and Production Association”
Saint Petersburg, Russia
2JSC "Research Institute of Scientific Instruments”
Lytkarino, Moscow Region, Russia
e-mail: SAFilatov@niipribor.ru

A way of solving the task of offshore area monitoring using a group of unmanned undersea vehicles (UUV) is reviewed. In order to determine life limit of radiation-hard UUV equipment amid the search of deviations there were tests of the main representatives of the UUV equipment conducted to assess the level of hardness to special factor effect. An UUV life limit estimating framework has been built due to the limit level obtained, the maximum time has been forecasted for the equipment to be fraught with the search of radioactive anomalies, and the impact of the radiation load level on equipment life reduction has been determined.

Keywords: search of radioactive anomalies, UUV, scintillator, hardness assessing methodology, existent hardness, forecasted life limit.
Isotope Gamma Unit K-12000: Profiles of Exposure Dose Rate and Energy Spectrum of Photons

E.V. Mitin1, E.N. Nekrasova1, V.N. Lomasov2, E.A. Golikhina3, A.V. Grunin3,
S.A. Lazarev3, A.I. Loskot4

1LLC “NPC “Granat”
Saint Petersburg, Russia
e-mail: enekrasova@npcgranat.ru
2Peter the Great St. Petersburg Polytechnic University
Saint Petersburg, Russia
3RFNC All-Russian Research Institute of Experimental Physics
Sarov, Nizhny Novgorod region, Russia
4Alexander Mozhaysky Military Space Academy
Saint Petersburg, Russia

The results of the measurements of the exposure dose rate in predesigned areas of the gamma unit chamber, gained during primary qualification, are presented. Additionally, the calculation results of the energy spectra of photons and the distribution of exposure dose rate are presented. Numerical simulation has been conducted by the Monte Carlo method in the 3D-simulator, recognizing realistic geometry of the unit. One can observe a good fit of calculation results with experimental data.

Keywords: gamma unit, energy spectrum, exposure dose, primary qualification, Monte Carlo method.

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